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Single artificial atoms in silicon emitting at telecom wavelengths

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arxiv 2001.02136 v1 pith:HPQRKN24 submitted 2020-01-07 physics.app-ph cond-mat.mes-hallquant-ph

Single artificial atoms in silicon emitting at telecom wavelengths

classification physics.app-ph cond-mat.mes-hallquant-ph
keywords quantumatomssingleartificialsilicondefectsintegratedoptical
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
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Given its unrivaled potential of integration and scalability, silicon is likely to become a key platform for large-scale quantum technologies. Individual electron-encoded artificial atoms either formed by impurities or quantum dots have emerged as a promising solution for silicon-based integrated quantum circuits. However, single qubits featuring an optical interface needed for large-distance exchange of information have not yet been isolated in such a prevailing semiconductor. Here we show the isolation of single optically-active point defects in a commercial silicon-on-insulator wafer implanted with carbon atoms. These artificial atoms exhibit a bright, linearly polarized single-photon emission at telecom wavelengths suitable for long-distance propagation in optical fibers. Our results demonstrate that despite its small bandgap (~ 1.1 eV) a priori unfavorable towards such observation, silicon can accommodate point defects optically isolable at single scale, like in wide-bandgap semiconductors. This work opens numerous perspectives for silicon-based quantum technologies, from integrated quantum photonics to quantum communications and metrology.

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