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Understanding the direct detection of charged particles with SiPMs

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arxiv 2210.13244 v1 pith:3E7D3WIG submitted 2022-10-20 physics.ins-det hep-ex

Understanding the direct detection of charged particles with SiPMs

F. Carnesecchi , G. Vignola , N. Agrawal , A. Alici , P. Antonioli , S. Arcelli , F. Bellini , D. Cavazza
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L. Cifarelli M. Colocci S. Durando F. Ercolessi A. Ficorella C. Fraticelli M. Garbini M. Giacalone A. Gola D. Hatzifotiadou N. Jacazio A. Margotti G. Malfattore R. Nania F. Noferini G. Paternoster O. Pinazza R. Preghenella R. Rath R. Ricci L. Rignanese N. Rubini B. Sabiu E. Scapparone G. Scioli S. Strazzi S. Tripathy A. Zichichi
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classification physics.ins-det hep-ex
keywords chargedparticlesprotectionresponsesensorsbeencherenkovdetection
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In this paper evidence that the increased response of SiPM sensors to the passage of charged particles is related mainly to Cherenkov light produced in the protection layer is reported. The response and timing properties of sensors with different protection layers have been studied.

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