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Direct detection of charged particles with SiPMs

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arxiv 2202.04160 v2 pith:YABAK5E2 submitted 2022-02-08 physics.ins-det hep-ex

Direct detection of charged particles with SiPMs

F. Carnesecchi , G. Vignola , N. Agrawal , A. Alici , P. Antonioli , S. Arcelli , F.Bellini , D. Cavazza
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L. Cifarelli M. Colocci S. Durando F. Ercolessi M. Garbini M. Giacalone D. Hatzifotiadou N. Jacazio A. Margotti G. Malfattore R. Nania F. Noferini O. Pinazza R. Preghenella R. Ricci L. Rignanese N. Rubini E. Scapparone G. Scioli S. Strazzi S. Tripathy A. Zichichi
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classification physics.ins-det hep-ex
keywords timebeambeenchargedcrosstalkdifferentdirectindicate
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The direct response of Silicon PhotoMultipliers being traversed by a MIP charged particle have been studied in a systematic way for the first time. Using beam test data, time resolution and the crosstalk probability have been measured. A characterization of the SiPM by means of a laser beam is also reported. The results obtained for different sensors indicate a measured time resolution around 40-70 ps. Although particles are expected to traverse only one SPAD per event, crosstalk measurements on different sensors indicate an unexpected higher value with respect to the one related to the sensor noise.

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