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Measurement of the transmission secondary electron yield of nanometer-thick films in a prototype Timed Photon Counter

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arxiv 2010.12462 v1 pith:T5YBB7Q7 submitted 2020-10-23 physics.ins-det hep-ex

Measurement of the transmission secondary electron yield of nanometer-thick films in a prototype Timed Photon Counter

T. H. A. van der Reep , B. Looman , H. W. Chan , C. W. Hagen , H. van der Graaf This is my paper
classification physics.ins-det hep-ex
keywords yieldelectronfilmsprototypesecondarytransmissioncountermeasure
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We measure the transmission secondary electron yield of nanometer-thick Al$_2$O$_3$/TiN/Al$_2$O$_3$ films using a prototype version of a Timed Photon Counter (TiPC). We discuss the method to measure the yield extensively. The yield is then measured as a function of landing energy between $1.2$ and $1.8$ keV and found to be in the range of $0.1$ ($1.2$ keV) to $0.9$ ($1.8$ keV). These results are in agreement to data obtained by a different, independent method. We therefore conclude that the prototype TiPC is able to characterise the thin films in terms of transmission secondary electron yield. Additionally, observed features which are unrelated to the yield determination are interpreted.

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