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Results of the 2015 testbeam of a 180 nm AMS High-Voltage CMOS sensor prototype

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arxiv 1603.07798 v3 pith:Q2XIHXKH submitted 2016-03-25 physics.ins-det hep-ex

Results of the 2015 testbeam of a 180 nm AMS High-Voltage CMOS sensor prototype

classification physics.ins-det hep-ex
keywords cmoshigh-voltagepixelprototyperesultssensortechnologytestbeam
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
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Active pixel sensors based on the High-Voltage CMOS technology are being investigated as a viable option for the future pixel tracker of the ATLAS experiment at the High-Luminosity LHC. This paper reports on the testbeam measurements performed at the H8 beamline of the CERN Super Proton Synchrotron on a High-Voltage CMOS sensor prototype produced in 180 nm AMS technology. Results in terms of tracking efficiency and timing performance, for different threshold and bias conditions, are shown.

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