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Design and Testing of Kinetic Inductance Detectors Made of Titanium Nitride

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arxiv 1309.4317 v1 pith:LI4MO7XR submitted 2013-09-17 astro-ph.IM physics.ins-det

Design and Testing of Kinetic Inductance Detectors Made of Titanium Nitride

classification astro-ph.IM physics.ins-det
keywords beenchipchipsdesignsdetectorshybridinductancekinetic
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
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To use highly resistive material for Kinetic Inductance Detectors (KID), new designs have to be done, in part due to the impedance match needed between the KID chip and the whole 50 ohms readout circuit. Chips from two new hybrid designs, with an aluminum throughline coupled to titanium nitride microresonators, have been measured and compared to a TiN only chip. In the hybrid chips, parasitic temperature dependent box resonances are absent. The dark KID properties have been measured in a large set of resonators. A surprisingly long lifetime, up to 5.6 ms is observed in a few KIDs. For the other more reproducible devices, the mean electrical Noise Equivalent Power is 5.4 10-19 W.Hz1/2.

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