REVIEW
Investigation of the dynamics of ionization induced injected electrons under the influence of beam loading effects
Not yet reviewed by Pith; the record is open.
This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.
SPECIMEN: schema-true, not a live event
T0 review · schema-true
One-sentence machine reading of the paper's core claim.
pith:XXXXXXXX · record.json · timestamp
Investigation of the dynamics of ionization induced injected electrons under the influence of beam loading effects
read the original abstract
In laser-driven wakefield, ionization induced injection is an efficient way to inject electrons in the plasma wave. A detailed study on the beam dynamics under the influence of beam loading effects, which can be controlled by the concentration of nitrogen impurity introduced in the hydrogen gas was conducted. For a specific value of this percentage, the final energy of the high-energy electron bunch becomes nearly independent of the trapped positions, thus leading to a small energy dispersion. We also show that the final beam emittance is mainly determined by the injection process.
discussion (0)
Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.