Pith. sign in

REVIEW

Contribution of dielectrics to frequency and noise of NbTiN superconducting resonators

Not yet reviewed by Pith; the record is open.

Re-run · record.json Download PDF Read on arXiv ↗

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv 0804.3499 v2 pith:K3ODYJT3 submitted 2008-04-22 cond-mat.mes-hall cond-mat.supr-con

Contribution of dielectrics to frequency and noise of NbTiN superconducting resonators

R. Barends , H. L. Hortensius , T. Zijlstra , J. J. A. Baselmans , S. J. C. Yates , J. R. Gao , T. M. Klapwijk This is my paper
classification cond-mat.mes-hall cond-mat.supr-con
keywords frequencynoiseresonanceresonatorssioxtemperaturenbtinthickness
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
0 comments
read the original abstract

We study NbTiN resonators by measurements of the temperature dependent resonance frequency and frequency noise. Additionally, resonators are studied covered with SiOx dielectric layers of various thicknesses. The resonance frequency develops a non-monotonic temperature dependence with increasing SiOx layer thickness. The increase in the noise is independent of the SiOx thickness, demonstrating that the noise is not dominantly related to the low temperature resonance frequency deviations.

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.