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arxiv 2212.01914 v3 pith:KRXP65LN submitted 2022-12-04 physics.optics

Investigation of the electro-optic effect in high-Q 4H-SiC microresonators

classification physics.optics
keywords h-siceffectelectro-opticinvestigationmaterialmicroresonatorspockelscarbide
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
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Silicon carbide (SiC) recently emerged as a promising photonic and quantum material owing to its unique material properties. Here, we carry out an exploratory investigation of the electro-optic effect in high-quality-factor 4H-SiC microresonators. Our findings confirm the existence of the Pockels effect in 4H-SiC for the first time. The extracted Pockels coefficients show certain variations among 4H-SiC wafers from different manufacturers, with the magnitudes of $r_{13}$ and $r_{33}$ estimated to be in the range of (0.3-0.7) pm/V and (0-0.03) pm/V, respectively.

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