REVIEW
Semiparametric Testing with Highly Persistent Predictors
Not yet reviewed by Pith; the record is open.
This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.
SPECIMEN: schema-true, not a live event
T0 review · schema-true
One-sentence machine reading of the paper's core claim.
pith:XXXXXXXX · record.json · timestamp
Semiparametric Testing with Highly Persistent Predictors
read the original abstract
We address the issue of semiparametric efficiency in the bivariate regression problem with a highly persistent predictor, where the joint distribution of the innovations is regarded an infinite-dimensional nuisance parameter. Using a structural representation of the limit experiment and exploiting invariance relationships therein, we construct invariant point-optimal tests for the regression coefficient of interest. This approach naturally leads to a family of feasible tests based on the component-wise ranks of the innovations that can gain considerable power relative to existing tests under non-Gaussian innovation distributions, while behaving equivalently under Gaussianity. When an i.i.d. assumption on the innovations is appropriate for the data at hand, our tests exploit the efficiency gains possible. Moreover, we show by simulation that our test remains well behaved under some forms of conditional heteroskedasticity.
discussion (0)
Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.