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Revisit the spin-FET: Multiple reflections, inelastic scattering, and lateral size effects
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Revisit the spin-FET: Multiple reflections, inelastic scattering, and lateral size effects
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We revisit the spin-injected field effect transistor (spin-FET) by simulating a lattice model based on recursive lattice Green's function approach. In the one-dimensional case and coherent regime, the simulated results reveal noticeable differences from the celebrated Datta-Das model, which motivate thus an improved treatment and lead to analytic and generalized result. The simulation also allows us to address inelastic scattering (using B\"uttiker's fictitious reservoir approach) and lateral confinement effects on the control of spins which are important issues in the spin-FET device.
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