Pith. sign in

REVIEW

Long hold times in a two-junction electron trap

Not yet reviewed by Pith; the record is open.

Re-run · record.json Download PDF Read on arXiv ↗

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv 1108.1684 v1 pith:YWQPHCZN submitted 2011-08-08 cond-mat.mes-hall cond-mat.supr-con

Long hold times in a two-junction electron trap

A. Kemppinen , S. V. Lotkhov , O.-P. Saira , A. B. Zorin , J. P. Pekola , A. J. Manninen This is my paper
classification cond-mat.mes-hall cond-mat.supr-con
keywords trapholdincreaseagreementassistedcotunnelingdemonstrateelectron
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
0 comments
read the original abstract

The hold time $\tau$ of a single-electron trap is shown to increase significantly due to suppression of environmentally assisted tunneling events. Using two rf-tight radiation shields instead of a single one, we demonstrate increase of $\tau$ by a factor exceeding $10^3$, up to about 10 hours, for a trap with only two superconductor (S) -- normal-metal (N) tunnel junctions and an on-chip resistor $R$ (R-SNS structure). In the normal state, the improved shielding made it possible to observe $\tau\sim$ 100 s, which is in reasonable agreement with the quantum-leakage-limited level expected for the two-electron cotunneling process.

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.