Pith. sign in

REVIEW

Sequential Selection for Accelerated Life Testing via Approximate Bayesian Inference

Not yet reviewed by Pith; the record is open.

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv 2001.05602 v1 pith:JOQB4UNW submitted 2020-01-16 stat.ME

Sequential Selection for Accelerated Life Testing via Approximate Bayesian Inference

classification stat.ME
keywords materialsequentialupdateacceleratedapproximatebayesiandesignexplicit
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
0 comments
read the original abstract

Accelerated life testing (ALT) is typically used to assess the reliability of material's lifetime under desired stress levels. Recent advances in material engineering have made a variety of material alternatives readily available. To identify the most reliable material setting with efficient experimental design, a sequential test planning strategy is preferred. To guarantee a tractable statistical mechanism for information collection and update, we develop explicit model parameter update formulas via approximate Bayesian inference. Theories show that our explicit update formulas give consistent parameter estimates. Simulation study and a case study show that the proposed sequential selection approach can significantly improve the probability of identifying the material alternative with best reliability performance over other design approaches.

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.