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Integrity report for Ultra-thin Topological Insulator Bi2Se3 Nanoribbons Exfoliated by Atomic Force Microscopy

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1007.1285 · pith:2010:COHTM4O2L5T5H5HM2RJWVMSCIE

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Last checked

Paper page arXiv integrity.json bundle.json

Detector runs

Findings

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Signed record

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