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Paper Integrity Record · LEDGER

Epitaxial growth and characterization of high quality Bi2O2Se thin films on SrTiO3 substrates by pulsed laser deposition

As of an unrecorded date, Pith completed 0 of 0 listed checks against arXiv:1907.07893. No listed check completed, so this record makes no findings claim.

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pith.integrity.v1
1907.07893 v2
pith:2019:XFGOTLJUSQ6KOF4EENLW2S2WVB

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